Prof. Kim`s R.P.

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  • 141 S. Choi, H. Kim, C. Jo, H.-S. Kim, S.-J. Choi, D. M. Kim, D. H. Kim "A Study on the Degradation of In–Ga–Zn–O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution" IEEE ELECTRON DEVICE LETTERS, vol. 36. no. 7, pp. 690-692, 2015-06 PDF
  • 140 K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim,K. R. Kim,D. H. Kim "Extraction of Propagation Delay-Correlated Mobility and Its Verification for Amorphous InGaZnO Thin-Film Transistor-Based Inverters" IEEE Transactions on Electron Devices, vol. 62. no. 5, pp. 1504-1510, 2015-05 PDF
  • 139 J. T. Jang, J. Park, B. D. Ahn, D. M. Kim, S.-J. Choi, H.-S. Kim, D. H. Kim "Effect of direct current sputtering power on the behavior of amorphous indium-galliumzinc- oxide thin-film transistors under negative bias illumination stress" Applied Physics Letters, vol. 106, p. 123505, 2015-04 PDF
  • 138 J. S. Hwang, H. Bae, J. Lee, S.-J. Choi, D. H. Kim, D. M. Kim "Sub-Bandgap Photonic Capacitance-Voltage Method for Characterization of the Interface Traps in Low Temperature Poly-Silicon Thin-Film Transistors" IEEE Electron Device Letters, vol. 36, no. 4, pp.339-341, 2015-04 PDF
  • 137 J. Lee, H. Bae, J. S. Hwang, J. Ahn, J. T. Jang, J. Yoon, S.-J. Choi, D. H. Kim, D. M. Kim "Modeling and Separate Extraction Technique for Gate Bias-Dependent Parasitic Resistances and Overlap Length in MOSFETs" IEEE Transactions on Electron Devices, vol. 62, no. 3, pp. 1063-1067, 2015-03 PDF
  • 136 B. Choi, J. Lee, J. Yoon, J.-H. Ahn, T. J. Park, D. M. Kim, D. H. Kim, S.-J. Choi "TCAD-Based Simulation Method for the Electrolyte–Insulator–Semiconductor Field-Effect Transistor" IEEE Transactions on Electron Devices, vol. 62, no. 3, pp. 1072-1075, 2015-03 PDF
  • 135 S. Jun, H. Bae, H. Kim, J. Lee, S.-J. Choi, D. H. Kim,D. M. Kim "Dual-Sweep Combinational Transconductance Technique for Separate Extraction of Parasitic Resistances in Amorphous Thin-Film Transistors" IEEE Electron Device Letters, vol. 36, no. 2, pp. 144-146, 2015-02 PDF
  • 134 J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, D. M. Kim, D. H. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi "Accurate extraction of mobility in carbon nanotube network transistors using C-V and IV measurements" Applied Physics Letters, vol. 105, p.212103, 2014-11 PDF
  • 133 J. Jang, D. G. Kim, D. M. Kim, S.-J. Choi, J.-H. Lim, J.-H. Lee, Y.-S. Kim, B. D. Ahn, and D. H. Kim "Investigation on the negative bias illumination stress-induced instability of amorphous indium-tin-zinc-oxide thin film transistors" Applied Physics Letters, vol. 105, p. 152108, 2014-10 PDF
  • 132 E. K.-H. Yu, S. Jun, D. H. Kim, and J. Kanicki "Density of states of amorphous In-Ga-Zn-O from electrical and optical characterization" J. Appl. Phys., vol. 116. 154505 -1-6, 2014-10 PDF
  • 131 H. Bae, H. Seo, S. Jun, H. Choi, J. Ahn, J. Hwang, J. Lee, S. Oh, J.-U. Bae, S.-J. Choi, D. H. Kim, and D. M. Kim "Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs" IEEE Transactions on Electron Devices, vol. 61. no. 10. pp, 3566 - 3569, 2014-10 PDF
  • 130 J. C. Park, I.-T. Cho, E.-S. Cho, D. H. Kim, C.-Y. Jeong, and H.-I. Kwon "Comparative Study of ZrO2 and HfO2 as a High-k Dielectric for Amorphous InGaZnO Thin Film Transistors" Journal of Nanoelectronics and Optoelectronics, vol. 9, pp. 67-70, 2014-02 PDF
  • 129 J. Lee, B. Choi, S. Hwang, J. H. Lee, B.-G. Park, T. J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi "Investigation of Sensor Performance in Accumulation- and Inversion-Mode Silicon Nanowire pH Sensors" IEEE Transactions on Electron Devices, vol. 61. no. 5 pp. 1607-1610, 2014-05 PDF
  • 128 W. H. Lee, J.-M. Lee, M. Uhm, J. Lee, K. R. Kim, S.-J. Choi, D. M. Kim, Y.-J. Jeong, and D. H. Kim "Characterization and Capacitive Modeling of Target Concentration-Dependent Subthreshold Swing in Silicon Nanoribbon Biosensors" IEEE Electron Device Letters, vol. 35. no. 5. pp 587-589, 2014-05 PDF
  • 127 J. Lee, J. Jang, H. Kim, J. Lee, B.L. Lee, S.-J. Choi, D. M. Kim, D. H. Kim, and K. R. Kim "Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors" IEEE Electron Device Letters, vol, 35, no. 3, pp. 396-398, 2014-02 PDF
  • 126 S. Kim, J. C. Park, D. H. Kim, and J.-S. Lee "Effects of Hf Incorporation on Negative Bias-Illumination Stress Stability in Hf–In–Zn–O Thin-Film Transistors" J. Appl. Phys., vol. 52, p. 041701, 2013-05 PDF
  • 125 J. Lee, S. Jun, J. Jang, H. Bae, H. Kim, J. W. Chung, S. -J. Choi, D. H. Kim, J. Lee, and D. M. Kim "Fully Transfer Characteristic-based Technique for Surface Potential and Subgap Density-of-States in p-Channel Polymer-based TFTs" IEEE Electron Device Letters, vol. 34, No. 12, pp. 1521-1523, 2013-11 PDF
  • 124 M. Bae, K. M. Lee, E.-S. Cho, H.-I. Kwon, D. M. Kim, and D. H. Kim "Analytical Current and Capacitance Models for Amorphous Indium-Gallium-Zinc-Oxide" IEEE Transactions Electron Devices, vol. 60, No. 10, pp. 3465-3473, 2013-10 PDF
  • 123 D. H. Kim, H. K. Jung, W. Yang, D. H. Kim, and S. Y. Lee "Investigation on mechanism for instability under drain current stress in amorphous Si–In–Zn–O thin-film transistors"" Thin Solid Films, vol. 527, pp. 314-317, 2013-01, 2013-01 PDF
  • 122 J. S. Shin, H. Bae, E. Hong, J. Jang, D. Yun, J. Lee, D. H. Kim, and D. M. Kim "Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I-V and low frequency C-V measurement" Solid-State Electron, , 2012-01 PDF