Prof. Kim`s R.P.

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  • 132 J. S. Hwang, H. Bae, H. Choi, J. Ahn, J. Lee, S.-J Choi, D. H. Kim, and D. M. Kim "A Dual Sweep Transfer Curve Technique for Separate Extraction of Source and Drain Resistances in Advanced FETs without Substrate Contacts" The 21st Korean Conference on Semiconductors(KCS 2014), p. 71, 2014-02 PDF
  • 131 B. Choi, J. Lee, D. M. Kim, D. H. Kim, and S.-J. Choi "An accurate and efficient simulation technique for FET-type biosensors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 443, 2014-02 PDF
  • 130 H. Choi, H. Bae, J. Ahn, J. S. Hwang, J. Lee, S.-J. Choi, D. H. Kim, and D. M. Kim "Capacitance-Voltage Technique for Extraction of Intrinsic Subgap DOS in AOS TFTs with Bias-Dependent Channel Conduction Factor Model" The 21st Korean Conference on Semiconductors(KCS 2014). p. 297, 2014-02 PDF
  • 129 Y. H. Kim, D. G. Kim, J.-D. Kim, S.-J. Choi, D. M. Kim, T.-S. Yoon, and D. H. Kim "Characterization of γ-Fe2O3 memristors via physics-based empirical I-V model" The 21st Korean Conference on Semiconductors(KCS 2014), p. 372, 2014-02 PDF
  • 128 S. Choi, J. Jang, H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. M. Kim, D. J. Shin, S.-J. Choi, D. M. Kim, and D. H. Kim "Constant current stress-induced instability of the top-gate IZO TFTs for AMOLED displays" The 21st Korean Conference on Semiconductors(KCS 2014), p. 107, 2014-02 PDF
  • 127 D. Shin, S. Jun, K. M. Lee, H. Kim, C. Jo, J. Jang, J. Lee, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of ultra-thin active layer thickness on the subthreshold slope and bipolar bias stress-induced degradation in amorphous InGaZnO thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 52, 2014-02 PDF
  • 126 H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. Min Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of gate/drain voltage configuration on electrical degradation of the bottom-gate In-Ga-Zn-O thin-film transistors driving AMOLED displays" The 21st Korean Conference on Semiconductors(KCS 2014), p. 111, 2014-02 PDF
  • 125 J. T. Jang, K. M. Lee, H. Kim, J. Jang, D. J. Shin, S. Choi, J. Lee, C. Jo, S. Jun, S.-J. Choi, D. M. Kim, and D. H. Kim "Effect of the RF power in sputter system on performance and photoelectric degradation of amorphous indium-gallium-zinc-oxide thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 56, 2014-02 PDF
  • 124 K. M. Lee, S. Jun, H. Kim, C. Jo, J. Jang, J. Lee, D. J. Shin, J. T. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Oxygen vacancy-dependent density-of-states and its effect on the negative bias illumination stress-induced degradation in amorphous oxide semiconductor thin-film transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 54, 2014-02 PDF
  • 123 J. Lee, J. Jang, H. Kim, C. Jo, S. Jun, K. M. Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "The Effect of Passivation on the Positive Bias Stress-Induced Instability of Polymer Thin-Film Transistors" The 21st Korean Conference on Semiconductors(KCS 2014), p. 296, 2014-02 PDF
  • 122 C. Jo, H. Kim, S. Jun, D. J. Shin, K. M. Lee, J. Jang, J. Lee, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim "Study on Physical Mechanism on the Positive Bias Stress-Induced Degradation ofAmorphous InGaZnO Thin-Film Transistors with Density-of-States BasedCharacterization" The 21st Korean Conference on Semiconductors(KCS 2014), p. 96, 2014-02 PDF
  • 121 D. H. Kim, K.-M. Lee, and J. T. Jang "Material Effects on Photoelectric Instability of Amorphous Oxide Thin-Film Transistors" ICEIC 2014, Kota Kinabalu, Malaysia, 2014-01 PDF
  • 120 J. Lee, S. Hwang, B. Choi, J. H. Lee, B.-G. Park, D.-I. Moon, M.-L. Seol, C.-H. Kim, Y.-K. Choi, D. M. Kim, D. H. Kim, S.-J. Choi "A Novel SiNW/CMOS Hybrid Biosensor for High Sensitivity/Low Noise" IEDM Dig. Tech. Papers, 2013-12 PDF
  • 119 J. Jang, J. Lee, H. Kim, J. Lee, J. W. Chung, B. Lee, D. M. Kim, S.-J. Choi, D. H. Kim "Inkjet Printed Polymer SRAM-cell Design for Flexible FPGA with Physical Parameter-Based TFT Model" IEDM Dig. Tech. Papers, 2013-12 PDF
  • 118 T. S. Kim, H.-S. Kim, J. S. Park, K. S. Son, E. S. Kim, J.-B. Seon, S. Lee, S.-J. Seo, S.-J. Kim, S. Jun., K. M. Lee, D. J. Shin, J. Lee, C. Jo, D. H. Kim, M. Ryu, S.-H. Cho and Y. Park "High performance gallium-zinc oxynitride thin film transistors for next-generation display applications" IEDM Dig. Tech. Papers, 2013-12 PDF
  • 117 J. Lee, S. Hwang, B. Choi, S. Choi, J. H. Lee, B.-G. Park, D. M. Kim, S.-J. Choi and D. H. Kim "Noise-Immune Silicon Nanowire/CMOS Hybrid Biosensor Using Top-Down Approach" MicroTAS 2013, 2013-10 PDF
  • 116 J. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "Top-Down Silicon Nanowire FETs for Biosensors" ITC-CSCC 2013, p.144, 2013-07 PDF
  • 115 J. Jang, J. Lee, H. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim "Density-of-States Based Numerical and Analytical Models for Solution-Processed Polymer TFTs" ITC-CSCC 2013, p.357, 2013-07 PDF
  • 114 D. H. Kim, K. M. Lee, S.-J. Choi, and D. M. Kim "Density-of-States Based Modeling of Oxide Thin-Film Transistors: Toward Instability-Aware Design" AWAD 2013, p.67, (Invited talk), 2013-06 PDF
  • 113 C. Jo, H. Bae, S. Jun, H. Choi, S. Hwang, D. H. Kim, and D. M. Kim "Characterization of Asymmetrical Negative Bias Stress Effect on the Density-of-States and Parasitic Resistances in a-IGZO Thin-Film Transistors" in SID'13 Dig. Tech. Papers, 2013-05 PDF
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