132J. S. Hwang, H. Bae, H. Choi, J. Ahn, J. Lee, S.-J Choi, D. H. Kim, and D. M. Kim"A Dual Sweep Transfer Curve Technique for Separate Extraction of Source and Drain Resistances in Advanced FETs without Substrate Contacts"The 21st Korean Conference on Semiconductors(KCS 2014), p. 71, 2014-02PDF
131B. Choi, J. Lee, D. M. Kim, D. H. Kim, and S.-J. Choi"An accurate and efficient simulation technique for FET-type biosensors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 443, 2014-02PDF
130H. Choi, H. Bae, J. Ahn, J. S. Hwang, J. Lee, S.-J. Choi, D. H. Kim, and D. M. Kim"Capacitance-Voltage Technique for Extraction of Intrinsic Subgap DOS in AOS TFTs with Bias-Dependent Channel Conduction Factor Model"The 21st Korean Conference on Semiconductors(KCS 2014). p. 297, 2014-02PDF
129Y. H. Kim, D. G. Kim, J.-D. Kim, S.-J. Choi, D. M. Kim, T.-S. Yoon, and D. H. Kim"Characterization of γ-Fe2O3 memristors via physics-based empirical I-V model"The 21st Korean Conference on Semiconductors(KCS 2014), p. 372, 2014-02PDF
128S. Choi, J. Jang, H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. M. Kim, D. J. Shin, S.-J. Choi, D. M. Kim, and D. H. Kim"Constant current stress-induced instability of the top-gate IZO TFTs for AMOLED displays"The 21st Korean Conference on Semiconductors(KCS 2014), p. 107, 2014-02PDF
127D. Shin, S. Jun, K. M. Lee, H. Kim, C. Jo, J. Jang, J. Lee, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of ultra-thin active layer thickness on the subthreshold slope and bipolar bias stress-induced degradation in amorphous InGaZnO thin-film transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 52, 2014-02PDF
126H. Kim, J. Jang, J. Lee, C. Jo, S. Jun, K. Min Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of gate/drain voltage configuration on electrical degradation of the bottom-gate In-Ga-Zn-O thin-film transistors driving AMOLED displays"The 21st Korean Conference on Semiconductors(KCS 2014), p. 111, 2014-02PDF
125J. T. Jang, K. M. Lee, H. Kim, J. Jang, D. J. Shin, S. Choi, J. Lee, C. Jo, S. Jun, S.-J. Choi, D. M. Kim, and D. H. Kim"Effect of the RF power in sputter system on performance and photoelectric degradation of amorphous indium-gallium-zinc-oxide thin-film transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 56, 2014-02PDF
124K. M. Lee, S. Jun, H. Kim, C. Jo, J. Jang, J. Lee, D. J. Shin, J. T. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Oxygen vacancy-dependent density-of-states and its effect on the negative bias illumination stress-induced degradation in amorphous oxide semiconductor thin-film transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 54, 2014-02PDF
123J. Lee, J. Jang, H. Kim, C. Jo, S. Jun, K. M. Lee, D. J. Shin, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"The Effect of Passivation on the Positive Bias Stress-Induced Instability of Polymer Thin-Film Transistors"The 21st Korean Conference on Semiconductors(KCS 2014), p. 296, 2014-02PDF
122C. Jo, H. Kim, S. Jun, D. J. Shin, K. M. Lee, J. Jang, J. Lee, J. Jang, S. Choi, S.-J. Choi, D. M. Kim, and D. H. Kim"Study on Physical Mechanism on the Positive Bias Stress-Induced Degradation ofAmorphous InGaZnO Thin-Film Transistors with Density-of-States BasedCharacterization"The 21st Korean Conference on Semiconductors(KCS 2014), p. 96, 2014-02PDF
121D. H. Kim, K.-M. Lee, and J. T. Jang"Material Effects on Photoelectric Instability of Amorphous Oxide Thin-Film Transistors"ICEIC 2014, Kota Kinabalu, Malaysia, 2014-01PDF
120J. Lee, S. Hwang, B. Choi, J. H. Lee, B.-G. Park, D.-I. Moon, M.-L. Seol, C.-H. Kim, Y.-K. Choi, D. M. Kim, D. H. Kim, S.-J. Choi"A Novel SiNW/CMOS Hybrid Biosensor for High Sensitivity/Low Noise"IEDM Dig. Tech. Papers, 2013-12PDF
119J. Jang, J. Lee, H. Kim, J. Lee, J. W. Chung, B. Lee, D. M. Kim, S.-J. Choi, D. H. Kim"Inkjet Printed Polymer SRAM-cell Design for Flexible FPGA with Physical Parameter-Based TFT Model"IEDM Dig. Tech. Papers, 2013-12PDF
118T. S. Kim, H.-S. Kim, J. S. Park, K. S. Son, E. S. Kim, J.-B. Seon, S. Lee, S.-J. Seo, S.-J. Kim, S. Jun., K. M. Lee, D. J. Shin, J. Lee, C. Jo, D. H. Kim, M. Ryu, S.-H. Cho and Y. Park"High performance gallium-zinc oxynitride thin film transistors for next-generation display applications"IEDM Dig. Tech. Papers, 2013-12PDF
117J. Lee, S. Hwang, B. Choi, S. Choi, J. H. Lee, B.-G. Park, D. M. Kim, S.-J. Choi and D. H. Kim"Noise-Immune Silicon Nanowire/CMOS Hybrid Biosensor Using Top-Down Approach"MicroTAS 2013, 2013-10PDF
116J. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim"Top-Down Silicon Nanowire FETs for Biosensors"ITC-CSCC 2013, p.144, 2013-07PDF
115J. Jang, J. Lee, H. Kim, S.-J. Choi, D. M. Kim, and D. H. Kim"Density-of-States Based Numerical and Analytical Models for Solution-Processed Polymer TFTs"ITC-CSCC 2013, p.357, 2013-07PDF
114D. H. Kim, K. M. Lee, S.-J. Choi, and D. M. Kim"Density-of-States Based Modeling of Oxide Thin-Film Transistors: Toward Instability-Aware Design"AWAD 2013, p.67, (Invited talk), 2013-06PDF
113C. Jo, H. Bae, S. Jun, H. Choi, S. Hwang, D. H. Kim, and D. M. Kim"Characterization of Asymmetrical Negative Bias Stress Effect on the Density-of-States and Parasitic Resistances in a-IGZO Thin-Film Transistors"in SID'13 Dig. Tech. Papers, 2013-05PDF