Prof. Choi`s R.P.

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  • 59 J.-Y. Kim, S. Choi, H. Kang, J. Kim, S.-J. Choi, D. M. Kim. D. H. Kim "Compartmentalization of the Physical Origin on the VT Variation of IGZO TFT under Current Stress by Combining I-V Curve and TCAD" The 23st Korean Conference on Semiconductors(KCS 2016), p. 43, 2016-02 PDF
  • 58 J. Park, K. M. Lee, D. M. Kim, S.-J. Choi, D. H. Kim "The density-of-states based C-V extraction in amorphous In-Ga-Zn-O thin-film transistors and the 3D TCAD-based verification" 2015년도 정기총회 및 추계학술대회, 2015-11 PDF
  • 57 S. Kim, J. H. Lee, D. M. Kim, S. -J. Choi, B. -G. Park, D. H. Kim, and H. -S. Mo "CURRENT-MIRROR TYPE SILICON NANOWIRE BIOSENSOR WITH PROGRAMMABLE CURRENT REFERENCE" 19th International Conference on Miniaturized Systems for Chemistry and Life Sciences (MicroTAS 2015), 2015-10 PDF
  • 56 J. Kim, H. M. Choi, H.-S. Mo, J. H. Lee, D. M. Kim, S.-J. Choi, B.-G. Park, D. H. Kim, and J. Park "ANALYSIS OF HYSTERESIS AND DYNAMIC TRANSFER CHARACTERISTICS BY TIME DEPENDENCE IN SINW BIOSENSOR" 19th International Conference on Miniaturized Systems for Chemistry and Life Sciences (MicroTAS 2015), 2015-10 PDF
  • 55 J. Kim, J. T. Jang, S. Choi, J. Kim, H. Kang, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis of hump characteristics induced self-heating and charge trapping in bottom-gate etch-stopper a-IGZO TFTs after simultaneous positive gate and drain bias stress" IMID 2015 DIGEST, 2015-08 PDF
  • 54 S. Choi, J. Kim, J. Kim, J. T. Jang, H. Kang, D. M. Kim, S.-J. Choi, J. C. Park, D. H. Kim "Positive Bias Stress in Flowing Drain Current-induced Degradations in Self-Aligned Top-Gate a-IZO TFTs" IMID 2015 DIGEST, 2015-08 PDF
  • 53 H. Kang, J. T. Jang, S.-J. Choi, D. M. Kim, D. H. Kim "Investigation of PBS-induced instability under various stress condition in a-IGZO TFT" 대한전자공학회 하계학술대회, 2015-06 PDF
  • 52 J. Kim, J. Kim, S. Choi, D. M. Kim, S.-J. Choi, D. H. Kim "The Analysis of Instability for Oxygen Flow Rate in Positive Bias Stress on High Gate Voltage or High Drain Voltage in a-IGZO Bottom-gate TFT" 대한전자공학회 하계학술대회, 2015-06 PDF
  • 51 J.T. Jang, H. Kang, J.H. Kim, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis on the low VGS/high VDS stress-induced instability in amorphous indium-gallium-zinc-oxide thin-film transistors" ICEIC 2015, 2015-02 PDF
  • 50 S. Choi, Y. Kang, J. Kim, S.-J. Choi, D. M. Kim, H.-Y. Cha, H. Kim, D. H. Kim "Frequency-dependent C-V Based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Field-effect Transistors" ICEIC 2015, 2015-02 PDF
  • 49 J. Lee, B. Choi, J. Yoon, M. Jeon, J. Jang, D. M. Kim, D. H. Kim, and S.-J. Choi "Analysis of structural dependences on the electrical performance of vertical organic field-effect transistor (VOFET)" The 22st Korean Conference on Semiconductors(KCS 2015), p. 67 , 2015-02 PDF
  • 48 H. M. Choi, J. Park, D. J. Shin, B. Choi, S. Kim, H. Mo, D. M. Kim, S.-J. Choi, D. H. Kim "Biosensing comparison between dry and wet environment in silicon nanowire transistor" The 22st Korean Conference on Semiconductors(KCS 2015), 2015-02 PDF
  • 47 D. H. Kim, J. Jang, K. M. Lee, S. -J. Choi, and D. M. Kim "Subgap Density-of-States (DOS)-based Simulation for Instability-Aware Design of Oxide TFTs" CAD-TFT 2014, 2014-10 PDF
  • 46 K. M. Lee, J. T. Jang, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "Negative Bias Illumination Stress Time-Evolution of Subgap States in Amorphous InGaZnO Thin-Film Transistors: Oxygen Vacancy?" IMID 2014 DIGEST, p. 11, 2014-08 PDF
  • 45 D. H. Kim, J. Jang, K. M. Lee, S.-J. Choi, and D. M. Kim "Toward instability-aware design of oxide TFTs(Invited)" IMID 2014 DIGEST, p. 198, 2014-08 PDF
  • 44 J. Jang, S.-J. Choi, D. M. Kim, J.-H. Lim, J.-H. Lee, B. D. Ahn, and D. H. Kim "Negative Bias Illumination Stress-Induced Instability in Amorphous Indium-Tin- Zinc-Oxide TFTs and Its Comparison with Indium-Gallium-Zinc-Oxide TFTs" IMID 2014 DIGEST, p. 199, 2014-08 PDF
  • 43 J. T. Jang, K. M. Lee, J. Jang, S.-J. Choi, D. M. Kim, and D. H. Kim "The Effect of RF Sputtering Power on Negative Bias Illumination Stress-Induced Instability in Sputtered Amorphous InGaZnO Thin-Film Transistors" IMID 2014 DIGEST, p. 358, 2014-08 PDF
  • 42 S. Choi, J. Jang, H. Kim, D. G. Kim, K. M. Lee, J. H. Kim, D. M. Kim, S.-J. Choi, J. C. Park, and D. H. Kim "VGS/VDS Configuration-Dependence of Positive Bias Stress-Induced Instability in Self-Aligned Top-Gate IZO TFTs" IMID 2014 DIGEST, p. 359, 2014-08 PDF
  • 41 J. Yoon, D. Lee, C. Kim, J. Lee, B. Choi, N. Yoder, J. Humes, D. H. Kim, D. M. Kim, M. Lee, Y.-K. Choi, and S.-J. Choi "Highly separated semiconducting carbon nanotube (99.9%) thin-film transistor using printing technology" IMID 2014 DIGEST, p. 568, 2014-08 PDF
  • 40 J. S. Hwang, H. Bae, H. Choi, J. Ahn, J. Lee, S.-J Choi, D. H. Kim, and D. M. Kim "A Dual Sweep Transfer Curve Technique for Separate Extraction of Source and Drain Resistances in Advanced FETs without Substrate Contacts" The 21th Korean Conference on Semiconductors(KCS 2014), 2014-02 PDF