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  • 227 J. T. Jang, H. R. Yu, G. Ahn, S.-J. Choi, D. M. Kim, Y.-S. Kim, S. Oh, J. H. Baeck, J. U. Bae, K.-S. Park, S. Y. Yoon, I. B. Kang, and D. H. Kim "Universal Method to Determine the Dynamic NBIS- and PBS-induced Instabilities on Self-aligned Coplanar InGaZnO Thin-film Transistors" Society of Information Display, 2018-05
  • 226 J. T. Jang, G. Ahn, D. Ko, H. R. Yu, H. Jung, C. Yoon, S. Lee, B. H. Park, H.-S. Mo, S.-J. Choi, D. M. Kim, and D. H. Kim "SPICE-based Simulation Study of Cu/AlOx/Pt Conductive-Bridge Resistive Access Memory-CMOS Integrated Circuit for Reconfigurable Logic" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 225 B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, Y. Kim, J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi* "A pseudo-CMOS inverter with top-gated 99% semiconducting carbon nanotube network transistors" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 224 Y. Lee, B. Choi, J. Yoon, J. Han, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, and S.-J. Choi* "99% semiconducting carbon nanotube-based diode and application in logic circuits" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 223 J. Park, B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, Y. Kim, D. M. Kim, D. H. Kim, and S.-J. Choi* "Directly drawn carbon nanotube transistors with a high device yield and uniform performance" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 222 Y. Kim, B. Choi, J. Yoon, Y. Lee, J. Han, J. Lee, J. Park, D. M. Kim, D. H. Kim, and S.-J. Choi* "Optimization of the performance in humidity sensor based on pre-separated 99% metallic single-walled carbon nanotube" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 221 G. Ahn, J. T. Jang, D. Ko, H. Yu, H. Jung, J. Rhee, H.-S. Mo, S.-J. Choi, D. M. Kim, D. H. Kim "Analysis of LRS retention fail based on Joule heating effect in InGaZnO RRAM" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 220 S. Choi, J.-Y. Kim, J. Kim, J. Rhee, H. R. Yu, H. Kang, S.-J. Choi, D. M. Kim, and D. H. Kim "Extraction Method of Temperature-Independent Subgap Density-of-States of a-IGZO TFTs by using Fermi-Dirac distribution" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 219 H. R. Yu, J. T. Jang, G. Ahn, S.-J. Choi, D. M. Kim, and D. H. Kim "Study on Negative Bias Stress-induced Instability in Zinc Oxynitride Thin-Film Transistors using Systematic Decomposition" The 24th Korean Conference on Semiconductors, 2018-02 PDF
  • 218 J. T. Jang, S.-J. Choi, D. M. Kim, D. H. Kim "Activation Energy Window-Based Modeling on the NBIS-induced Instability in Amorphous InGaZnO Thin-Film Transistors" ICEIC, 2018-01 PDF
  • 217 J. Yoon†, B. Choi†, Y. Lee, J. Han, J. Lee, J. Park, Y. Kim, D. M. Kim, D. H. Kim, M.-H. Kang, S. Kim*, S.-J. Choi*( †These authors equally contributed to this work)(*co-corresponding authors) "Monolithically 3D-Printed Pressure Sensors for Application in Electronic Skin and Healthcare Monitoring" IEDM, 2017-12 PDF
  • 216 J. Rhee, S. Choi, J.-Y. Kim, S.-J. Choi, D. M. Kim,and D. H. Kim* "Relationship between the tunneling distance and stretched-exponential function model on the positive bias stress-induced charge trapping in IGZO TFTs" IMID 2017, 2017-08 PDF
  • 215 D. H. Kim, S. Choi, J. Jang, H Kang, D. M. Kim, S.-J. Choi, Y.-S. Kim, S. Oh, J. H. Baeck, J. U. Bae, K.-S. Park, S. Y. Yoon, and In B. Kang "Experimental Decomposition of the Positive Gate-bias Temperature Stressinduced Instability and Its Modeling in InGaZnO Thin-film Transistors" IMID 2017, 2017-08 PDF
  • 214 B. Choi, J. Yoon, D. M. Kim, D. H. Kim, and S.-J. Choi "High-performance top-gated 99% semiconducting carbon nanotube network transistor with high device yield and uniformity" NANO KOREA, 2017-07 PDF
  • 213 J. Yoon, J. Han, B. Choi, D. M. Kim, D. H. Kim, and S.-J. Choi "Carbon nanotube transistor on 3-D printed polyvinyl alcohol (PVA) substrate for transient electronics" NANO KOREA, 2017-07 PDF
  • 212 Y. Lee, J. Yoon, B. Choi, H. Lee, D. M. Kim, D. H. Kim, and S.-J. Choi "High-performance, ink-jet printed 99% semiconducting carbon nanotube transistors with enhanced contact interfaces" NANO KOREA, 2017-07 PDF
  • 211 D. H. Kim, S. Choi, J. Jang, H. Kang, D. M. Kim, S.-J. Choi, Y.-S. Kim, S. Oh, J. H. Baeck, J. U. Bae, K.-S. Park, S. Y. Yoon, and In B. Kang "Experimental Decomposition of the Positive Bias Temperature Stressinduced Instability in Self-aligned Coplanar InGaZnO Thin-film Transistors and its Modeling based on the Multiple Stretched-exponentia" Society of Information Display, 2017-05 PDF
  • 210 H. R. Yu, J. T. Jang, S. Choi, H. Kang, D. Ko, J-.Y. Kim, G. Ahn, J. Lee, S.-J Choi, D. M. Kim, and D. H. Kim* "Influence of active layer thickness on the abnormal output characteristics in amorphous In-Ga-Zn-O TFTs under high current-flowing operation" The 24th Korean Conference on Semiconductors, 2017-02 PDF
  • 209 J. Rhee, S. Choi, H. Kang, J.-Y. Kim, J. T. Jang, D. Ko, S.-J. Choi, D. M. Kim, and D. H. Kim* "TCAD-based analysis on the relationship between the physical parameters in charge trapping and the stretched exponential model parameters in amorphous InGaZnO TFTs under the positive gate bias tempera" The 24th Korean Conference on Semiconductors, 2017-02 PDF
  • 208 S. Choi, J. T. Jang, H. Kang, J.-Y. Kim, D. Ko, J. Rhee, H. R. Yu, J. Park, S.-J. Choi, D. M. Kim, and D. H. Kim* "TCAD-based comparative study on the positive bias stress instability between the single-gate and double-gate structured In-Ga-Zn-O TFTs" The 24th Korean Conference on Semiconductors, 2017-02 PDF