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  • 107 정현광, 공동식, 김용식, 배민경, 김재형, 김우준, 허인석, 이재욱, 김윤혁, 전성우, 조춘형, 김동명, 김대환 "Amorphous Silicon 박막트랜지스터의 Negative Bias Illumination Stress 하에서의 물리적 Parameter 기반 신뢰성 특성 분석" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 106 김우준, 배민경, 김용식, 김재형, 허인석, 장재만, 정현광, 공동식, 김윤혁 이재욱, 조춘형, 전성우, 김동명, 김대환 "Analytical Model-based SPICE Simulation ofr the Design of Amorphous InGaZnO Thin-Film Transistors-based Circuits" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 105 J. Kim, J. Jang, M. Bae, W. Kim, I. Hur, Y. Kim, H. Jeong, D. Kong, J. Lee, Y. H. Kim, S. Jun, C. H. Jo, D. M. Kim,and D. H. Kim "Characterization of Density-of-States in olymer-based Organic Thin Film Transistors and Implementation into TCAD Simulator" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 104 I. Hur, H. Bae, M. Bae, Y. Kim, D. Kong, H. Jeong, J. Jang, J. Kim, W. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. M. Kim, and D. H. Kim "Characterization of Intriinsic Field Effect Mobiliity in a-IGZO Thin-Film Transistors Through the De-embedding the Parasitic Source and Drain Resistance Effects" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 103 J. Lee, J. H. Lee, H. Jang, M. Uhm, W. H. Lee, S. Hwang, B.-G. Park, I.-Y. Chung, D. M. Kim and D. H. Kim "CMOS-Compatible Inverter-Type Si Nanoribbon Biosensor with High Sensitivity" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 102 M. Bae, D. Yun, Y. Kim, D. Kong, H. Jeong, J. Jang, W. Kim, I. Hur, J. Kim, Y. H. Kim, J. Lee, S. Jun, C. H. Jo, D. H. Kim, and D. M. Kim "Differential Ideality Factor Technique and Extraction of Subgap Density-of-States in Amorphous InGaZnO Thin-Film Transistors" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 101 J. S. Shin, H. Bae, E. Hong, J. Jang, D. Yun, H. Seo, H. Choi, D. H. Kim, and D. M. Kim "Separate Extraction Technique of Gate, Source, Drain, and Substrate Resistances in Individual MOSFET Combining I-V and C-V Characteristics" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 100 J. S. Shin, H. Choi, H. Bae, J. Jang, D. Yun, E. Hong, H. Seo, D. H. Kim, and D. M. Kim "Si/SiGe Vertical Gate DHBT (VerDHBT)-based 1T DRAM Cell For Improved Retention Characteristics With a Large Hysteresis window" The 19th Korean Conference on Semiconductors, 2012-02 PDF
  • 99 J. H. Lee, J. Lee, M-C Sun, W. H. Lee, M Uhm, S. Hwang, I-Y Chung, D. M. Kim, D. H. Kim, and B-G Park "Analysis of hysteresis characteristics of fabricated SiNW biosensor in aqueous environment with reference electrode" Silicon Nanoelectronics Workshop (SNW), 2012 IEEE Digital Object Identifier, 2012- PDF
  • 98 J.‐H. Ahn, J.‐Y. Kim, C. Jung, D.‐I. Moon, S.‐J. Choi, C.‐H. Kim, K.‐B. Lee, H. G. Park, and Y.‐K. Choi "CMOS-Based Biosensors with an Independent Double‐Gate FinFET" IEEE International Electron Device Meeting (IEDM), 2011-12 PDF
  • 97 D.‐I. Moon, J.‐S. Oh, S.‐J. Choi, S. Kim, J.‐Y. Kim, M.‐S. Kim, Y.‐S. Kim, M.‐H. Kang, J.‐W. Kim, and Y.‐K. Choi "Multi‐Functional Universal Device using a Band‐Engineered Vertical Structure" IEEE International Electron Device Meeting (IEDM), 2011-12 PDF
  • 96 M. Lim, S.‐J. Choi, K. Moon, E. Jung, M.‐L. Seol, Y. Do, Y.‐K. Choi, and H. Han "Terahertz Time Domain Spectroscopy of Vertical Silicon Nanowires" 36th International Conference on Infrared, Millimeter, and Terahertz Waves, 2011-10 PDF
  • 95 D. J. Baek, S.‐J. Choi, D.‐I. Moon, and Y.‐K. Choi "Scaling of the Pull‐In Voltage in a Novel CMOS‐compatible NEMS Switch" Solid State Devices and Materials (SSDM), 2011-09 PDF
  • 94 H. Jang, J. Lee, J. H. Lee, H. Seo, M. Uhm, W. H. Lee, D. M. Kim, I.-Y. Chung and D. H. Kim "Analytical of current hysteresis of SiNW in the aqueous solution depending on measurement biases" 2011 11th IEEE NANO, 2011-08 PDF
  • 93 S.‐J. Choi, D.‐I. Moon, J. P. Duarte, S. Kim, and Y.‐K. Choi "A Novel Junctionless All‐Around‐Gate SONOS Device with a Quantum Nanowire on a Bulk Substrate for 3D Stack NAND Flash Memory" Symposium on VLSI Technology Digest of Technical Papers (VLSI), pp. 74‐75, 2011-06 PDF
  • 92 S. Kim, S.‐J. Choi, D.‐I. Moon, and Y.‐K. Choi "Optical‐Charge Pumping: A Universal Trap Characterization Technique for Nanoscale Floating Body Devices" Symposium on VLSI Technology Digest of Technical Papers (VLSI), pp. 190‐191, 2011-06 PDF
  • 91 M. Bae, Y. Kim, W. Kim, D. Kong, H. Jung, Y. W. Jeon, S. Kim, I. Hur, J. Kim, D. M. Kim, D. H. Kim, B. D. Ahn, S. Y. Park, J.-H. Park, J. H. Kim, J. Park, and J.-H. Lee "Analytical I-V and C-V Models for Amorphous InGaZnO TFTs and their Application to Circuit Simulations" in SID'11 Dig. Tech. Papers, 2011-05 PDF
  • 90 D. Kong, H. Jung, Y. Kim, M. Bae, Y. W. Jeon, S. Kim, J. Jang, J. Kim, W. Kim, I. Hur, D. M. Kim, D. H. Kim, B. D. Ahn, S. Y. Park, J.-H. Park, J. H. Kim, J. Park, and J.-H. Lee "Density-of-States Based Analysis on the Effect of Active Thin-film Thickness on Current Stress-induced Instability in Amorphous InGaZnO AMOLED Driver TFTs" in SID'11 Dig. Tech. Papers, 2011-05 PDF
  • 89 D. Yun, J. Jang, H. Bae, J. S. Shin, J. Lee, H. Jang, E. Hong, W. H. Lee, M. Uhm, H. Seo, D. H. Kim, and D. M. Kim "A Study on the Hfin dependence of Intrinsic gate delay in FinFET" The 18th Korean Conference on Semiconductors, 2011-02 PDF
  • 88 H. Bae, J. Jang, J. S. Shin, D. Yun, J. Lee, H. Jang, E. Hong, D. H. Kim, and D. M. Kim "Modeling and Separate Extraction of Gate Bias- and Channel Length-Dependent intrinsic and Extrinsic Resistance Elements in LDD MOSFETs" The 18th Korean Conference on Semiconductors, 2011-02 PDF